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SEMI MF1188:2007(R2018)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline

Available format(s)

Hardcopy

Superseded date

15-12-2023

Language(s)

English

Published date

01-07-2018

This Test Method covers the determination of the interstitial oxygen content of single crystal silicon by measurement of an infrared absorption band at room temperature, using a short baseline drawn between 1040 cm1 and 1160 cm1 to reduce the uncertainties due to perturbations in the IR absorption at the end-point regions of longer baselines that arise from effects other than absorption by interstitial oxygen. Use of the short baseline results in improved precision of the method.

DocumentType
Test Method
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy
Supersedes

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£145.16
Excluding VAT

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