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SEMI MF1366:2008(R2018)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry

Available format(s)

Hardcopy

Superseded date

16-11-2023

Language(s)

English

Published date

01-10-2018

This Test Method covers the determination of total oxygen concentration in the bulk of single crystal silicon substrates using SIMS.

DocumentType
Test Method
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy
Supersedes

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£145.16
Excluding VAT

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