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UNE-EN 15991:2011

Current

Current

The latest, up-to-date edition.

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2016

Committee
CTN 61
DocumentType
Standard
Pages
29
PublisherName
Asociacion Espanola de Normalizacion
Status
Current
SupersededBy

Standards Relationship
EN 15991:2011 Identical

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£64.06
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