UNE-EN 60749-28:2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
Hardcopy , PDF
English
01-08-2017
01-05-2022
This standard establishes the procedure for testing, evaluating, and classifying devices andmicrocircuits according to their susceptibility (sensitivity) to damage or degradation by exposureto a defined field-induced charged device model (CDM) electrostatic discharge (ESD). Allpackaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containingany of these devices are to be evaluated according to this standard. To perform the tests, thedevices must be assembled into a package similar to that expected in the final application. ThisCDM document does not apply to socketed discharge model testers. This standard describesthe field-induced (FI) method. An alternative, the direct contact (DC) method, is described inAppendix I
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4139-4
|
| Pages |
52
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| EN 60749-28:2017 | Identical |
| IEC 60749-28:2017 | Identical |
| BS 3900-C9:1982 | Identical |
| BS EN 60749-28:2017 | Equivalent |
| I.S. EN 60749-28:2017 | Equivalent |
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