UNE-EN 60749-3:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)
Hardcopy , PDF
English
01-07-2017
The purpose of this part of IEC 60749 is to verify that the materials, design, construction,markings, and workmanship of a semiconductor device are in accordance with the applicableprocurement document. External visual inspection is a non-destructive test and applicable forall package types. The test is useful for qualification, process monitor, or lot acceptance, orboth.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4001-4
|
| Pages |
21
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-3:2017 | Identical |
| IEC 60749-3:2017 | Identical |
| BS EN 60749-3:2017 | Equivalent |
| I.S. EN 60749-3:2017 | Equivalent |
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