UNE-EN 60749-4:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
Hardcopy , PDF
English
01-07-2017
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test(HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductordevices in humid environments.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4002-1
|
| Pages |
19
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-4:2017-11 | Equivalent |
| I.S. EN 60749-4:2017 | Equivalent |
| BS EN 60749-4:2017 | Equivalent |
| IEC 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.