UNE-EN IEC 60749-17:2019
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)
Hardcopy , PDF
English
01-06-2019
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. It is a destructive test.The objectives of the test are as follows:a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, andb) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-6702-8
|
| Pages |
17
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-17:2019 | Identical |
| EN IEC 60749-17:2019 | Identical |
| DIN EN IEC 60749-17:2019-11 | Equivalent |
| BS EN IEC 60749-17:2019 | Equivalent |
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