UNE-EN IEC 63287-1:2021
Current
The latest, up-to-date edition.
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
Hardcopy , PDF
English
01-11-2021
This part of IEC 63287-1 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military and space-related applications.NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
53
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| BS EN IEC 63287-1:2021 | Equivalent |
| I.S. EN IEC 63287-1:2021 | Equivalent |
| EN IEC 63287-1:2021 | Identical |
| IEC 63287-1:2021 | Identical |
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