UNE-EN IEC 63616:2026
Current
The latest, up-to-date edition.
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.)
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English
01-03-2026
This document relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivityof a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
In comparison with the conventional method described in IEC 61788-7, this method has the following characteristics:
" the value of the conductivity 5Øß of a metal foil can be measured accurately and non-destructively;
" the value of the interfacial conductivity 5Øß of a metal layer on a dielectric substrate can be measured accurately and non-destructively;
" this method presents broadband measurements by using higher-order modes by one resonator;
" this method is applicable for the measurements on the following condition:
frequency: 10 GHz d"5ØSÜd" 170 GHz; 22
conductivity: 105 S/m d"5Øßd" 108 S/m.
| Committee |
CTN 212/SC 46
|
| DocumentType |
Standard
|
| Pages |
21
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 63616:2025 | Identical |
| I.S. EN IEC 63616:2026 | Equivalent |
| EN IEC 63616:2026 | Identical |
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