UTEC 96 029 : 2011
Current
Current
The latest, up-to-date edition.
ELECTRONIC COMPONENTS - LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - GUIDE FOR IMPLEMENTATION
Published date
12-01-2013
Publisher
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| DevelopmentNote |
Indice de classement: C96-029U. (02/2012)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| UTEC 96 027-1 : 2011 | ELECTRONIC EQUIPMENT OBSOLESCENCE - GUIDE APPLIED OBSOLESCENCE MANAGEMENT |
| UTEC 96 004 : 2008 | AUDIT FOR OBSOLESCENCE MANAGEMENT |
| UTEC 96 027 : 2011 | OBSOLESCENCE ELECTRONIC COMPONENTS - RULES CONCERNING THE TREATMENT OF PRODUCT DISCONTINUANCE AND REPLACEMENT |
| UTEC 80 810 : 2005 | RELIABILITY DATA HANDBOOK - UNIVERSAL MODEL FOR RELIABILITY PREDICTION OF ELECTRONICS COMPONENTS, PCBS AND EQUIPMENT |
| IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
| NF EN 60068 2-17 : 1995 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST Q: SEALING |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC TR 61340-5-2:2007 | Electrostatics - Part 5-2: Protection of electronic devices from electrostatic phenomena - User guide |
| IEC TS 61945:2000 | Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis |
| NF ISO 2859-1 : 2000 AMD 1 2011 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION |
| EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
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