ASTM F 122 : 1974 : R1985
Withdrawn
Withdrawn
Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption (Withdrawn 1990)
Published date
01-12-2013
Withdrawn date
12-31-1990
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CONTAINED IN VOL 10.05 1995 Determines content of interstitial oxygen in single-crystal germanium; can be used on any specimen with recordable transmission of 11.7- m infrared radiation. Useful range of oxygen concentration measurable is 10 ppb atomic for sample thickness of 25 mm to solubility limit of 100 ppm atomic.
| DocumentType |
Test Method
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
| ASTM F 120 : 1988 | Practices for Determination of the Concentration of Impurities in Single Crystal Semiconductor Materials by Infrared Absorption Spectroscopy (Withdrawn 1993) |
| ASTM E 177 : 2014 : REDLINE | Standard Practice for Use of the Terms Precision and Bias in ASTM Test Methods |
| ASTM F 120 : 1988 | Practices for Determination of the Concentration of Impurities in Single Crystal Semiconductor Materials by Infrared Absorption Spectroscopy (Withdrawn 1993) |
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