BS EN 60749-34:2004
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Power cycling
Hardcopy , PDF
English
06-22-2004
01-01-2010
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.
| Standards | Relationship |
| EN 60749-34:2004 | Identical |
| IEC 60749-34:2004 | Identical |
| I.S. EN 60749-34:2004 | Equivalent |
| EN 60749-34:2004 | Equivalent |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.