BS EN 60749-43:2017
Withdrawn
View Superseded by
Semiconductor devices - Mechanical and climatic test methods Guidelines for IC reliability qualification plans
Hardcopy , PDF
English
09-22-2017
07-29-2022
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Product categories and applications
5 Failure
6 Reliability test
7 Stress test methods
8 Supplementary tests
9 Summary table of assumptions
10 Summary
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Provides guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs).
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 15/30269562 DC. (10/2017)
|
| DocumentType |
Standard
|
| Pages |
44
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
| Standards | Relationship |
| IEC 60749-43:2017 | Identical |
| EN 60749-43:2017 | Identical |
| I.S. EN 60749-43:2017 | Equivalent |
| UNE-EN 60749-43:2017 | Equivalent |
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