UNE-EN 60749-43:2017
Superseded
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Española de Normalización in October of 2017.)
Hardcopy , PDF
English
10-01-2017
11-01-2021
This Part of IEC 60749 gives guidelines for reliability qualification plans of semiconductorintegrated circuit products (ICs). This Part of IEC 60749 is not intended for military- andspace-related applications.NOTE: The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by thisguideline adoptation based on EDR4708. AEC Q100, JESD47 or other relevant document that can also beapplicable if it is specfied.NOTE: The Weibull distribution method used in this document is one method of several to calculate theappropriate sample size and test conditions of a given reliability project
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4471-5
|
| Pages |
46
|
| ProductNote |
THIS STANDARD ALSO REFERS TO JEITA EDR-4704A, JEDEC JEP122, JP001, JEITA EDR-4705,JEDEC JESD 85, JEITA EDR-4708
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| I.S. EN 60749-43:2017 | Equivalent |
| BS EN 60749-43:2017 | Equivalent |
| EN 60749-43:2017 | Identical |
| IEC 60749-43:2017 | Identical |
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