EN 60749-43:2017
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
09-01-2017
02-05-2022
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Product categories and applications
5 Failure
6 Reliability test
7 Stress test methods
8 Supplementary tests
9 Summary table of assumptions
10 Summary
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS EN 60749-43:2017 | Identical |
| NF EN 60749-43 : 2017 | Identical |
| I.S. EN 60749-43:2017 | Identical |
| IEC 60749-43:2017 | Identical |
| NEN EN IEC 60749-43 : 2017 | Identical |
| DS EN 60749-43 : 2017 | Identical |
| PN EN 60749-43 : 2018 | Identical |
| UNE-EN 60749-43:2017 | Identical |
| CEI EN 60749-43 : 1ED 2018 | Identical |