NF EN 60749-43 : 2017
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 43: GUIDELINES FOR IC RELIABILITY QUALIFICATION PLANS
Published date
01-24-2017
Publisher
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| DevelopmentNote |
Indice de classement: C96-022-43. PR NF EN 60749-43 November 2016. (01/2017)
|
| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-43:2017 | Identical |
| EN 60749-43:2017 | Identical |
Summarise
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