BS EN IEC 60749-13:2018
Current
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Hardcopy , PDF
English
04-30-2018
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS EN 60749-13. (06/2018)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
| Standards | Relationship |
| EN IEC 60749-13:2018 | Identical |
| IEC 60749-13:2018 | Identical |
| IEC 60749-13:2002 | Identical |
| DIN EN IEC 60749-13:2018-10 | Equivalent |
| IEC 60749-13:2018 | Equivalent |
| UNE-EN IEC 60749-13:2018 | Equivalent |
| EN IEC 60749-13:2018 | Equivalent |
| I.S. EN IEC 60749-13:2018 | Equivalent |
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