BS EN 60749-13:2002
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Hardcopy , PDF
English
09-17-2002
04-30-2018
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203574 DC (09/2002) Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| I.S. EN 60749-13:2002 | Identical |
| NBN EN 60749-13 : 2003 | Identical |
| IEC 60749-13:2002 | Identical |
| NF EN 60749-13 : 2002 | Identical |
| DIN EN 60749-13:2003-04 | Identical |
| EN 60749-13:2002 | Identical |
| UNE-EN 60749-13:2003 | Identical |
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