EN 60749-13:2002
Superseded
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Published date
08-16-2002
Superseded date
04-13-2018
Superseded by
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
| Committee |
CLC/SR 47
|
| DevelopmentNote |
Supersedes EN 60749. (06/2017) Redesignated as EN IEC 60749-13. (04/2018)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
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| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NF EN 60749-13 : 2002 | Identical |
| IEC 60749-13:2002 | Identical |
| NBN EN 60749-13 : 2003 | Identical |
| NEN EN IEC 60749-13 : 2002 | Identical |
| I.S. EN 60749-13:2002 | Identical |
| PN EN 60749-13 : 2004 | Identical |
| BS EN 60749-13:2002 | Identical |
| CEI EN 60749-13 : 2004 | Identical |
| DIN EN 60749-13:2003-04 | Identical |
| UNE-EN 60749-13:2003 | Identical |
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