DIN EN 60749-13:2003-04
Superseded
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
Hardcopy , PDF
German
01-01-2003
03-07-2021
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.
| DevelopmentNote |
Supersedes DIN EN 60749. (06/2005) DRAFT 2017 issued in July 2017. (07/2017)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Superseded
|
| Supersedes |
| Standards | Relationship |
| BS EN 60749-13:2002 | Identical |
| I.S. EN 60749-13:2002 | Identical |
| NBN EN 60749-13 : 2003 | Identical |
| IEC 60749-13:2002 | Identical |
| NF EN 60749-13 : 2002 | Identical |
| EN 60749-13:2002 | Identical |
| UNE-EN 60749-13:2003 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.