SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Published date

01-12-2013

Publisher

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Gives a salt atmosphere test that determine the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices which specified for a marine environment.

DevelopmentNote	Indice de classement: C96-022-13PR. (03/2003) Supersedes NF EN 60749. (06/2007) PR NF EN 60749-13 January 2018. (01/2018)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-13:2003-04	Identical
BS EN 60749-13:2002	Identical
I.S. EN 60749-13:2002	Identical
UNE-EN 60749-13:2003	Identical
EN 60749-13:2002	Identical

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NF EN 60749-13 : 2002

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory