IEC 60749-13:2002
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Hardcopy , PDF
04-12-2002
09-12-2022
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NEN EN IEC 60749-13 : 2002 | Identical |
| BS EN 60749-13:2002 | Identical |
| EN IEC 60749-13:2018 | Identical |
| CEI EN 60749-13 : 2004 | Identical |
| UNE-EN 60749-13:2003 | Identical |
| DIN EN 60749-13:2003-04 | Identical |
| BS EN IEC 60749-13:2018 | Identical |
| EN 60749-13:2002 | Identical |
| PN EN 60749-13 : 2004 | Identical |
| 17/30355772 DC : 0 | BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE |
| 13/30264596 DC : 0 | BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
| 13/30264600 DC : 0 | BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
| IEC 60747-14-4:2011 | Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers |
| 13/30264591 DC : 0 | BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
| BS IEC 60747-14-4:2011 | Semiconductor devices. Discrete devices Semiconductor accelerometers |
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