IEC 60749-13:2002
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Hardcopy , PDF
04-12-2002
09-12-2022
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| I.S. EN 60749-13:2002 | Equivalent |
| NEN EN IEC 60749-13 : 2002 | Identical |
| BS EN 60749-13:2002 | Identical |
| EN IEC 60749-13:2018 | Identical |
| CEI EN 60749-13 : 2004 | Identical |
| UNE-EN 60749-13:2003 | Identical |
| DIN EN 60749-13:2003-04 | Identical |
| BS EN IEC 60749-13:2018 | Identical |
| EN 60749-13:2002 | Identical |
| PN EN 60749-13 : 2004 | Identical |
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