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DD IEC PAS 62686-1 : DRAFT JULY 2011

Withdrawn

Withdrawn

View Superseded by

PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: GENERAL REQUIREMENTS FOR HIGH RELIABILITY INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS

Published date

11-23-2012

Withdrawn date

10-27-2018

Superseded by

PD IEC/TS 62686-1:2015

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FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Abbreviationstions
5 Technical requirements
Annex A (normative) - STACK Specification
        S/0001 Issue 14

Specifies the minimum requirements for general purpose 'off the shelf' COTS integrated circuits and discrete semiconductors for high reliability applications.

Committee
GEL/107
DocumentType
Draft
PublisherName
British Standards Institution
Status
Withdrawn
SupersededBy

Standards Relationship
IEC PAS 62686-1:2011 Identical

MIL-STD-883 Revision K:2016 Microcircuits
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC TS 62239:2008 Process management for avionics - Preparation of an electronic components management plan
MIL-STD-750 Revision F:2011 Test Methods for Semiconductor Devices
EN 100015-3 : 1993 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BASIC SPECIFICATION: REQUIREMENTS FOR CLEAN ROOM AREAS
IPC J STD 004 : B REQUIREMENTS FOR SOLDERING FLUXES
IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
IEC TS 62564-1:2016 Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors
IPC J STD 035 : 0 ACOUSTIC MICROSCOPY FOR NON-HERMETIC ENCAPSULATED ELECTRONIC COMPONENTS
IPC J STD 020D-1:2008 MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SURFACE MOUNT DEVICES

Sorry this product is not available in your region.