DIN EN 60749-40:2012-02
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE (IEC 60749-40:2011)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2012
US$136.55
Excluding Tax where applicable
| DevelopmentNote |
Supersedes DIN IEC 60749-40. (02/2012)
|
| DocumentType |
Standard
|
| Pages |
23
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60749-40:2011 | Identical |
| IEC 60749-40:2011 | Identical |
Summarise
US$136.55
Excluding Tax where applicable
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