Name: NF EN 60749-4:2017 - Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Brand: Association Francaise de Normalisation

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Published date

06-01-2017

Publisher

Association Francaise de Normalisation

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This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Committee	TC 47
DocumentType	Test Method
PublisherName	Association Francaise de Normalisation
Status	Current
Supersedes	NF EN 60749-4 : 2002

Standards	Relationship
EN 60749-4:2017	Identical

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NF EN 60749-4:2017

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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