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NF EN IEC 60749-30:2020

Current

Current

The latest, up-to-date edition.

Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Available format(s)

Hardcopy

Language(s)

French, English

Published date

09-01-2020

DocumentType
Test Method
Pages
19
PublisherName
Association Francaise de Normalisation
Status
Current
Supersedes

Standards Relationship
IEC 60749-30:2020 Identical
EN IEC 60749-30:2020 Identical

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