PN EN 60749-44 : 2017
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
Published date
05-10-2017
Publisher
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Summarise this standard
AI-generated summary
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-44:2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
Sorry this product is not available in your region.