Customer Support: +1 416-401-8730

Login to i2i Subscription Intertek.com
  • There are no items in your cart
Please enter a keyword to search
Advanced search
Home
Publishers
SEMI
SEMI M18 : 2012

SEMI M18 : 2012

Current

Current

The latest, up-to-date edition.

GUIDE FOR DEVELOPING SPECIFICATION FORMS FOR ORDER ENTRY OF SILICON WAFERS

Published date

01-12-2013

Publisher

Semiconductor Equipment & Materials Institute

Describes the methodology for developing specification forms for order entry including: - how to identify form sections, form columns, and form headings; - instructions for line format and how to number items; - how to add new items appropriate to a given wafer product to the form, and - how to reference new items from another section of the form.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI M24 : 2007 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON PREMIUM WAFERS
SEMI M1 : 2017 SPECIFICATION FOR POLISHED SINGLE CRYSTAL SILICON WAFERS
SEMI T6 : 1997(R2004) PROCEDURE AND FORMAT FOR REPORTING OF TEST RESULTS BY ELECTRONIC DATA INTERCHANGE (EDI)
SEMI M47 : 2007 SPECIFICATION FOR SILICON-ON-INSULATOR (SOI) WAFERS FOR CMOS LSI APPLICATIONS
ASTM F 154 : 2002 Standard Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces (Withdrawn 2003)
SEMI M62 : 2017 SPECIFICATIONS FOR SILICON EPITAXIAL WAFERS
SEMI M61 : 2007(R 2019) SPECIFICATION FOR SILICON EPITAXIAL WAFERS WITH BURIED LAYERS
ASTM F 1241 : 1995 : R2000 Standard Terminology of Silicon Technology (Withdrawn 2003)
SEMI M2 : 2003 SPECIFICATION FOR SILICON EPITAXIAL WAFERS FOR DISCRETE DEVICE APPLICATIONS
SEMI M32 : 2007 GUIDE TO STATISTICAL SPECIFICATIONS
SEMI M11 : 2004 SPECIFICATIONS FOR SILICON EPITAXIAL WAFERS FOR INTEGRATED CIRCUIT (IC) APPLICATIONS

SEMI M71 : 2012 SPECIFICATION FOR SILICON-ON-INSULATOR (SOI) WAFERS FOR CMOS LSI
SEMI M59 : 2014 TERMINOLOGY FOR SILICON TECHNOLOGY
SEMI M41 : 2015 SPECIFICATION OF SILICON-ON-INSULATOR (SOI) FOR POWER DEVICE/ICS
SEMI M24 : 2007 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON PREMIUM WAFERS
SEMI M57 : 2016 SPECIFICATION FOR SILICON ANNEALED WAFERS
SEMI M8 : 2012 SPECIFICATION FOR POLISHED MONOCRYSTALLINE SILICON TEST WAFERS
SEMI M61 : 2007(R 2019) SPECIFICATION FOR SILICON EPITAXIAL WAFERS WITH BURIED LAYERS
SEMI M62 : 2017 SPECIFICATIONS FOR SILICON EPITAXIAL WAFERS
SEMI M38 : 2012(R2018) SPECIFICATION FOR POLISHED RECLAIMED SILICON WAFERS
SEMI M16 : 2010(R2015) SPECIFICATION FOR POLYCRYSTALLINE SILICON

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

or

Get in touch with us