UNE-EN 60749-20:2009
Superseded
Superseded
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
07-01-2012
Publisher
Superseded date
11-09-2020
US$97.16
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
31
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| I.S. EN 60749-20:2009 | Equivalent |
| BS EN 60749-20:2009 | Equivalent |
| IEC 60749-20:2008 | Identical |
| IEC 60749-20:2002 | Identical |
| EN 60749-20:2009 | Identical |
Summarise
US$97.16
Excluding Tax where applicable