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04/30098988 DC : DRAFT OCT 2004

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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ISO 22335 - SURFACE CHEMICAL ANALYSIS - DEPTH PROFILING - MEASUREMENT OF SPUTTERING RATE - MESHREPLICA METHOD WITH THE USE OF A MECHANICAL STYLUS PROFILOMETER

Published date

23-11-2012

Superseded date

31-08-2007

Superseded by

PD ISO/TR 22335:2007

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Committee
CII/60
DocumentType
Draft
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 13565-3:1998 Geometrical Product Specifications (GPS) — Surface texture: Profile method; Surfaces having stratified functional properties — Part 3: Height characterization using the material probability curve
ISO 5436:1985 Calibration specimens — Stylus instruments — Types, calibration and use of specimens
ISO/TR 15969:2001 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
ISO 14606:2015 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
ISO 18115:2001 Surface chemical analysis — Vocabulary

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