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Superseded
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BS EN 60749-40 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE
Hardcopy , PDF
English
30-09-2011
1 Scope and object
2 Normative references
3 Terms and definitions
4 Test method and equipment
5 Test procedure
6 Test method
7 Summary
Annex A (Normative) - Drop impact test equipment
by using test rod
Annex B (Informative) - An example of strain gauge
attachment procedure
BS EN 60749-40
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
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