BS EN 60749-40:2011
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Hardcopy , PDF
English
30-09-2011
1 Scope
2 Normative references
3 Terms and definitions
4 Test equipment
5 Test procedure
6 Test method
7 Summary
Annex A (normative) - Drop impact test method
using test rod
Annex B (informative) - An example of strain gauge
attachment procedure
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
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