09/30209746 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
BS EN 60749-29 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Hardcopy , PDF
English
31-08-2011
1 Scope and object
2 Terms and definitions
3 Apparatus and material
3.1 Latch-up tester
3.1.1 V[supply] and their qualification method
3.1.2 Trigger source qualification method
3.2 Automated test equipment (ATE)
3.3 Heat source
4 Procedure
4.1 General latch-up test procedure
4.2 Detailed latch-up test procedure
4.2.1 I-test
4.2.2 V[supply] overvoltage test
4.2.3 Testing dynamic devices
4.2.4 DUT disposition
4.2.5 Record keeping
5 Failure criteria
6 Summary
Annex A (informative) - Examples of special pins that are
connected to passive components
A.1 General
A.2 Passive component pins
A.3 Digital differential input pins
BS EN 60749-29
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
25
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.