BS CECC 90000:1985
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Hardcopy , PDF
English
29-11-1985
29-03-1991
General details, quality assessment procedures, test and measurement procedures and details of screening requirements.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 81/31418 DC, 86/23012 DC, 86/23480 DC, 87/23549 DC & 90/33497 DC Inactive for the new design. Superseded by BS CECC90000(1991) but remains current for existing approvals. Supersedes BS 9400(1970). (05/2005)
|
| DocumentType |
Standard
|
| Pages |
200
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| CECC 90000 : 90 AMD 1 | Identical |
| EN 190102:1994 | Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S |
| BS EN 190102:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| IEC 60147-1:1972 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| BS 4727(1971) : LATEST | |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 2011(1967) : LATEST | |
| IEC 60191-3:1999 | Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| IEC 60147-2:1963 | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods |
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