BS CECC 90000:1991
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
29-03-1991
Publisher
Superseded date
15-03-1996
Superseded by
£348.00
Excluding VAT
Specifies the terms, definitions, symbols, test methods and other material for monolithic integrated circuits necessary to prepare appropriate detail specifications in the CECC system.
| Committee |
EPL/47
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 190000 but remains current due to existing approvals. Supersedes BS CECC90000(1985) & BS CECC90000:ADD1(1983) which remain current due to existing approvals. Supersedes 89/28880 DC, 89/28883 DC, 89/30237 DC, 90/20593 DC, 90/20594 DC, 90/24712 DC & 90/33496 DC (05/2005)
|
| DocumentType |
Standard
|
| Pages |
134
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| CECC 90000 : 90 AMD 1 | Identical |
| BS CECC 90103:1983 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90101:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
| BS CECC 90200:1988 | Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits |
| BS CECC 90114:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
| BS CECC 90201:1984 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 90115:1994 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
| BS EN 190103:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90300:1988 | Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits |
| BS CECC 90302:1986 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
| BS CECC 90104:1981 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. Mos digital integrated circuits, series 4000B and 4000UB |
| BS CECC 90104:1990 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
| BS EN 190101:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
| BS CECC 90201:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS CECC 90103:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90111:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
| BS CECC 90112:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| BS CECC 90203:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
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| BS CECC 90202:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| BS CECC 90301:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
| BS CECC 90113:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
| BS CECC 90000:Addendum No. 1:1983 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection |
| BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
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| BS 9400:1970 | Specification for integrated electronic circuits and micro-assemblies of assessed quality (qualification approval procedures): generic data and methods of test |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| CECC 00102 : 86 AMD 1 91 | CECC RULES OF PROCEDURE: RP 2: ADMINISTRATION PROCEDURES - ORGANISATION OF THE CECC GENERAL SECRETARIAT - CECC FINANCIAL ADMINISTRATION |
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| BS 6493-2.1:1985 | Semiconductor devices. Integrated circuits General |
| BS 6001-1(1999) : 1999 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - PART 1: SAMPLING SCHEMES INDEXED BY ACCEPTANCE QUALITY LIMIT (AQL) FOR LOT-BY-LOT INSPECTION |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 6493-2.4(1989) : 1989 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS |
| BS 6493-2.2(1986) : 1986 | SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS |
| BS CECC 00012:1985 | Harmonized system of quality assessment for electronic components: basic specification: radiographic inspection of electronic components |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 6100-1.3.6:1991 | Glossary of building and civil engineering terms. General and miscellaneous. Parts of construction works Jointing products, builders\' hardware and accessories |
| ISO 2015:1976 | Numbering of weeks |
| CECC 00200 : 2002 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER CECC CERTIFICATION SYSTEM FOR ELECTRONIC COMPONENTS |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 2011(1967) : LATEST | |
| BS 6493-2.3:1987 | Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits |
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Excluding VAT
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