BS EN 61967-6 : 2002
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
Hardcopy , PDF
English
01-01-2002
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) - Probe calibration
procedure - Microstrip line method
Annex B (informative) - Measurement principle and
calibration factor
Annex C (informative) - Spatial resolution of magnetic
probe
Annex D (informative) - Angle pattern of probe placement
Annex E (informative) - Advanced magnetic probe
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Bibliography
Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/202911 DC. (11/2002) 2002 Edition Re-issued in September 2008 & incorporates AMD 1 2008. Supersedes 05/30129026 DC. (10/2008)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DIN EN 61967-6:2008-10 | Identical |
| NF EN 61967-6 : 2003 AMD 1 2008 | Identical |
| IEC 61967-6:2002+AMD1:2008 CSV | Identical |
| I.S. EN 61967-6:2003 | Identical |
| EN 61967-6:2002/A1:2008 | Identical |
| NBN EN 61967-6 : 2002 AMD 1 2008 | Identical |
| EN 61967-6:2002 | Equivalent |
| I.S. EN 61967-6:2002/A1:2008 | Equivalent |
| UNE-EN 61967-6:2002 | Equivalent |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-4 : 2002 COR 2017 | INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017) |
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
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