NBN EN 61967-6 : 2002 AMD 1 2008

1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Measurement principle
5 Test conditions
  5.1 General
  5.2 Frequency range
6 Test equipment
  6.1 General
  6.2 Magnetic probe
  6.3 Probe spacing fixture and placement
7 Test set-up
  7.1 General
  7.2 Probe calibration
  7.3 Modifications to standardized IC test board
      7.3.1 Layer arrangement
      7.3.2 Layer thickness
      7.3.3 Decoupling capacitors
      7.3.4 I/O pin loading
8 Test procedure
  8.1 General
  8.2 Test technique
9 Test report
  9.1 General
  9.2 Documentation
Annex A (normative) Probe calibration procedure -
        Microstrip line method
Annex B (informative) Measurement principle and
        calibration factor
Annex C (informative) Spatial resolution of magnetic
        probe
Annex D (informative) Angle pattern of probe placement
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

Gives a method for evaluating RF currents on the pins of an integrated circuit (IC) by means on non-contact current measurement using a miniature magnetic probe.