BS EN 62047-3:2006
Current
The latest, up-to-date edition.
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Hardcopy , PDF
English
30-11-2006
Scope
2 Normative references
3 Test piece materials
4 Test piece fabrications
5 Plane shape of test piece
6 Test piece thickness
7 Gauge mark
8 Test
9 Document attached to standard test pieces
Annex A (informative) Test piece
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10[mu]m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 05/30104054 DC (12/2006)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.
| Standards | Relationship |
| NBN EN 62047-3 : 2007 | Identical |
| I.S. EN 62047-3:2006 | Identical |
| NF EN 62047-3 : 2006 | Identical |
| EN 62047-3:2006 | Identical |
| DIN EN 62047-3:2007-02 | Identical |
| IEC 62047-3:2006 | Identical |
| UNE-EN 62047-3:2006 | Equivalent |
| IEC 62047-2:2006 | Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials |
| EN 62047-2:2006 | Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials |
| ISO 17561:2016 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for elastic moduli of monolithic ceramics at room temperature by sonic resonance |
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