BS EN IEC 60749-13:2018
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Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Published date
30-04-2018
Publisher
This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
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