UNE-EN IEC 60749-13:2018
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Hardcopy , PDF
English
01-05-2018
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.The salt atmosphere test is considered destructive
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-5369-4
|
| Pages |
23
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| BS EN IEC 60749-13:2018 | Equivalent |
| DIN EN IEC 60749-13:2018-10 | Equivalent |
| EN IEC 60749-13:2018 | Identical |
| IEC 60749-13:2018 | Identical |
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