BS ISO 11938:2012
Current
The latest, up-to-date edition.
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Hardcopy , PDF
English
30-04-2013
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Procedure of mapping analysis
5 Methods for displaying element maps
6 Evaluation of uncertainty
7 Report
Annex A (normative) - Comparison of absorption
effects for a light element
Bibliography
Gives procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry.
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 10/30185165 DC. (04/2013)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.
| Standards | Relationship |
| ISO 11938:2012 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-6:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 6: Use in practice of accuracy values |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 22489:2016 | Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy |
| ISO 16592:2012 | Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
| ISO 17470:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.