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BS QC 790111:1993

Current

Current

The latest, up-to-date edition.

Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-09-1993

£166.00
Excluding VAT

One of a series of blank detail specifications for semiconductor devices in the IECQ system.

Committee
EPL/47
DevelopmentNote
Also numbered as IEC 60748-2-8 Supersedes 88/20405 DC (08/2005)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Current

IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
BS QC 001002:1991 Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS

£166.00
Excluding VAT