CEI EN 61788-15 : 2012
Current
The latest, up-to-date edition.
SUPERCONDUCTIVITY - PART 15: ELECTRONIC CHARACTERISTIC MEASUREMENTS - INTRINSIC SURFACE IMPEDANCE OF SUPERCONDUCTOR FILMS AT MICROWAVE FREQUENCIES
Hardcopy , PDF
English
01-01-2012
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test Report
Annex A (informative) - Additional information
relating to clauses 1 to 8
Annex B (informative) - Uncertainty considerations
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines measurements of the intrinsic surface impedance (Z[S]) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14][2].
| Committee |
CT 90
|
| DevelopmentNote |
Classificazione CEI 90-61. (09/2012)
|
| DocumentType |
Standard
|
| Pages |
54
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 61788-15:2011 | Identical |
| IEC 61788-15:2011 | Identical |
| IEC 61788-7:2006 | Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies |
| IEC 60050-815:2015 | International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology — Basic and general concepts and associated terms (VIM) |
| EN 61788-7:2006 | Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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