EN 60749-27:2006/A1:2012
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Amendment of
Published date
09-11-2012
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Summarise this standard
AI-generated summary
| Committee |
CLC/TC 47X
|
| DocumentType |
Amendment
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
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