EN 62433-3:2017
Current
The latest, up-to-date edition.
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
02-06-2017
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-RE macro-model description
6 REML format
7 Extraction
8 Validation
Annex A (normative) - Preliminary definitions for XML
representation
Annex B (informative) - Electromagnetic fields radiated
by an elementary electric and magnetic dipole
Annex C (informative) - Example files
Annex D (normative) - REML valid keywords and usage
Annex E (informative) - ICEM-RE extraction methods
Annex F (informative) - ICEM-RE model validation examples
Annex G (informative) - ICEM-RE macro-model usage examples
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
IEC62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| CEI EN 62433-3 : 1ED 2017 | Identical |
| UNE-EN 62433-3:2017 | Identical |
| SN EN 62433-3 : 2017 | Identical |
| DIN EN 62433-3 : 2017 | Identical |
| VDE 0847-33-3 : 2017 | Identical |
| PN EN 62433-3 : 2017 | Identical |
| IEC 62433-3:2017 | Identical |
| NF EN 62433-3 : 2017 | Identical |
| NEN EN IEC 62433-3 : 2017 | Identical |
| I.S. EN 62433-3:2017 | Identical |
| PNE-FprEN 62433-3 | Identical |
| BS EN 62433-3:2017 | Identical |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC TS 61967-3:2014 | Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method |
| IEC 62433-2:2017 | EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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