IEC 60749-36:2003
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Hardcopy , PDF
English - French
13-02-2003
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
7
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-36 : 2003 | Identical |
| NEN EN IEC 60749-36 : 2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| PN EN 60749-36 : 2005 | Identical |
| BS EN 60749-36:2003 | Identical |
| CEI EN 60749-36 : 2004 | Identical |
| EN 60749-36:2003 | Identical |
| DIN EN 60749-36:2003-12 | Identical |
| UNE-EN 60749-36:2004 | Identical |
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