EN 60749-36:2003
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Published date
17-04-2003
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Summarise this standard
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60749-36 : 2003 | Identical |
| IEC 60749-36:2003 | Identical |
| NBN EN 60749-36 : 2004 | Identical |
| NEN EN IEC 60749-36 : 2003 | Identical |
| I.S. EN 60749-36:2003 | Identical |
| PN EN 60749-36 : 2005 | Identical |
| BS EN 60749-36:2003 | Identical |
| CEI EN 60749-36 : 2004 | Identical |
| DIN EN 60749-36:2003-12 | Identical |
| BS EN 60601-2-33:2002+A2:2008 | Identical |
| UNE-EN 60749-36:2004 | Identical |
Sorry this product is not available in your region.