IEC 60749-5:2023
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Hardcopy , PDF
English - French
19-12-2023
IEC 60749-5:2023 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive. This edition includes the following significant technical changes with respect to the previous edition:
a) The specification of the test equipment is changed to require the need to minimize relative humidity gradients and maximize air flow between semiconductor devices under test;
b) The specification of the test equipment fixtures is changed to require the avoidance of condensation on devices under test and on electrical fixtures connecting the devices to the test equipment;
c) replacement of references to “virtual junction” with “die”.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| DIN EN IEC 60749-5:2024-09 | Identical |
| VDE 0884-749-5:2024-09 | Identical |
| DS/EN IEC 60749-5:2024 | Identical |
| CEI EN IEC 60749-5:2024 | Identical |
| UNE-EN IEC 60749-5:2024 | Identical |
| BS EN IEC 60749-5:2024 | Identical |
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