JIS C 5402-10-4:2006
Current
Current
The latest, up-to-date edition.
Connectors for electronic equipment -- Tests and measurements -- Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests -- Test 10d: Electrical overload (connectors)
Published date
25-03-2006
Publisher
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-10-4:2003 | Identical |
2006 [25/03/2006]2002 [20/03/2002]
| JIS C 5402-2-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method |
| JIS C 5402-1-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 1-1: General examination -- Test 1a: Visual examination |
| JIS C 5402-13-1:2002 | Connectors for electronic equipment -- Tests and measurements -- Part 13-1: Mechanical operating tests -- Test 13a: Engaging and separating forces |
Summarise
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