JIS C 5402-2-1:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment -- Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method
English
20-03-2005
This section of JIS C 5402-2 is to define a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge. This test may also be used for similar devices when specified in a detail specification.
| DocumentType |
Standard
|
| Pages |
3
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-2-1:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 5402-2-3:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 2-3: Electrical continuity and contact resistance tests -- Test 2c: Contact resistance variation |
| JIS C 5402-11-3:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-3: Climatic tests -- Test 11c: Damp heat, steady state Part 11-3: Climatic tests - Test 11c: Damp heat, steady state |
| JIS C 5402-6-2:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-2: Dynamic stress tests -- Test 6b: Bump |
| JIS C 5402-11-7:2006 | Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test |
| JIS C 5402-11-10:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-10: Climatic tests -- Test 11j: Cold Part 11-10: Climatic tests - Test 11j: Cold |
| JIS C 5402-10-4:2006 | Connectors for electronic equipment -- Tests and measurements -- Part 10-4: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests -- Test 10d: Electrical overload (connectors) |
| JIS C 5402-6-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-1: Dynamic stress tests -- Test 6a: Acceleration, steady state |
| JIS C 5402-6-3:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock |
| JIS C 5402-11-12:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-12: Climatic tests -- Test 11m: Damp heat, cyclic Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic |
| JIS C 5402-11-14:2006 | Connectors for electronic equipment -- Tests and measurements -- Part 11-14: Climatic tests -- Test 11p: Flowing single gas corrosion test Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test |
| JIS C 5402-6-4:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal) |
| JIS C 5402-11-9:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat Part 11-9: Climatic tests - Test 11i: Dry heat |
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